Visit us at Booth 200 to see our latest developments.
IONTOF is the leading European manufacturer of Time-of-Flight Secondary Ion Mass Spectrometers (TOF-SIMS). Our new M6 generation of instruments further improves on the market leading TOF.SIMS 5 instruments. With improved mass resolution, lateral resolution and new capabilities such as MS/MS the M6 is truly the most versatile SIMS instrument. The M6 provides detailed elemental and molecular information about surfaces, thin layers, and interfaces, with full 3D characterization. It's unique design guarantees optimum performance in all fields of SIMS applications. Utilizing our Argon Gas Cluster Ion Beam 3D characterization of organic materials is now possible. Recent developments include in-situ AFM for true 3D analyses and our hybrid SIMS system that offers mass resolutions over 200,000 and full MS/MS capability. Our Qtac100 is a high sensitivity Low Energy Ion Scattering system for true atomic layer characterization.