k-Space is a leading supplier of advanced metrology tools for the semiconductor and thin-film industries. Our metrology tools are used to monitor thin-film deposition processes including MBE, MOCVD, PLD, PVD, and sputtering, as well as in production.
Putting Light to Work Since 1992!
k-Space Associates, Inc. (www.k-space.com) is a leading supplier of advanced metrology instrumentation and software used in research and production facilities around the world.
We have metrology systems for RHEED analysis, thin-film stress and strain, wafer and film temperature, surface roughness and quality, film thickness, deposition rate, wafer curvature, bow, warp, and tilt. Our sophisticated software analysis and reporting capabilities provide information on the characteristics of your end product, and can give you online control during mass production to enhance yield.
Through extensive customer input, close collaboration with our worldwide customer base, and a strong commitment to unparalleled technical support, k-Space has developed today’s most powerful thin-film and industrial metrology tools.
Brands: kSA 400;
kSA ACE;
kSA BandiT;
kSA Emissometer;
kSA ICE;
kSA MOS;
kSA MOS UltraScan;
kSA MOS ThermalScan;
kSA RHEEDSim;
kSA SpectR;
kSA SpectraTemp