J.A. Woollam has over 30 years of experience in the Ellipsometry industry. We offer a lineup of tools for nondestructive materials characterization, including thin film thickness (single and multilayer), optical constants, composition, growth/etch rates, and more. We have instruments available for research and manufacturing metrology covering spectral ranges from the terahertz to vacuum ultra violet. Our patented technology has positioned us to achieve unmatched speed and accuracy of spectroscopic ellipsometry measurements and our analysis software is universally recognized as the best in the industry. With industry-leading technology and unrivaled personal support, we are the Ellipsometry Experts.