SPECS Surface Nano Analysis, Inc.
Welcome to SPECS
SPECS leads the way in state-of-the-art technology, cutting-edge components, and compact and individually designed systems for surface analysis. Our customized systems are highly integrated with facilities for sample and thin film preparation and in-situ analysis from UHV to high pressures. Our newest solution for environmental XPS is the award-winning EnviroESCA, which features quick sample throughput at Near Ambient Pressure. ARPES expansion and innovation led to the creation of the KREIOS 150, which combines a hemispherical analyzer with a new PEEM lens approach. This allows access to the full photo electron emission hemisphere (±90°). We also offer a variety of sources for deposition, excitation, and charge neutralizers as well as analyzers (the PHOIBOS line), X-Ray sources (µ-focus range), and research microscopes like LEEM and LT-STM (Unisoku portfolio).
Brands: PHOIBOS, THEMIS, KREIOS, FOCUS, XR 50, TMM, UVS, UVLS, IQE, IQP, EQ, FG, ErLEED, EBE, PCS-RF, PCS-ECR, MPS-ECR, TGC-H, Aarhus SPM, KolibriSensor, Curlew SPM, USM series Unisoku, FE-LEEM